Fast microtomography using high energy synchrotron radiation

At the High Energy Beamline ID15A at the European Synchrotron Radiation Facility we have developed a fast three-dimensional x-ray microtomography system, which acquires a complete dataset in typically less than 10s. This unprecedented speed is achieved by combining a high efficiency phosphor screen, a reflecting microscope objective and a fast charge coupled device detector with the very intense high-energy white beam radiation provided by a wiggler source. The achieved spatial resolution is 2μm. The available x-ray energy spectrum spans from 20to250keV and can therefore be used for low and high Z materials. The spectrum can be modified by inserting different filters into the x-ray beam in order to optimize the signal-to-noise ratio and to avoid beam-hardening artifacts. Different phosphors with different energy sensitivity can be used. The very high speed allows in situ studies of systems evolving on the time scale of a few seconds or minutes. Three examples are given on sintering of metallic powders, solidification of binary alloys and liquid front propagation in granular materials.