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DOI: 10.1063/1.111847
¤ OpenAccess: Green
This work has “Green” OA status. This means it may cost money to access on the publisher landing page, but there is a free copy in an OA repository.

Glancing angle x-ray diffraction: A different approach

B.A. van Brussel,J.T.M. de Hosson

Diffraction
Optics
Diffractometer
1994
This letter describes a novel technique of diffracted beam glancing angle x-ray diffraction by which depth profiles of stresses and transformed phases in structures like implanted materials can be determined. An important feature is that this method may be applied successfully in a standard powder diffractometer. It is shown that, beside the well-known incident beam glancing angle method which usually requires rather sophisticated equipment with parallel beam optics combined with more intense x-ray sources, diffracted beam glancing angle x-ray diffraction can be applied as well.
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    Glancing angle x-ray diffraction: A different approach” is a paper by B.A. van Brussel J.T.M. de Hosson published in 1994. It has an Open Access status of “green”. You can read and download a PDF Full Text of this paper here.