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DOI: 10.1016/s0920-5632(03)90986-8
OpenAccess: Closed
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Test beam results of a large area strip detector made on high resistivity Czochralski silicon
Eija Tuominen,K. Banzuzi,Sándor Czellár,A. Heikkinen,J. Härkönen,P. Johansson,Veikko Karimäki,Panja-Riina Luukka,P. Mehtälä,J. Niku,S. Nummela,J. Nystén,J. Simpura,E. Tuovinen,Jorma Tuominiemi,D. Ungaro,Tapio Vaarala,L. Wendland,Mikko Voutilainen,A. Zibellini
Silicon
Detector
Wafer
2003
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“Test beam results of a large area strip detector made on high resistivity Czochralski silicon” is a paper by Eija Tuominen K. Banzuzi Sándor Czellár A. Heikkinen J. Härkönen P. Johansson Veikko Karimäki Panja-Riina Luukka P. Mehtälä J. Niku S. Nummela J. Nystén J. Simpura E. Tuovinen Jorma Tuominiemi D. Ungaro Tapio Vaarala L. Wendland Mikko Voutilainen A. Zibellini published in 2003. It has an Open Access status of “closed”. You can read and download a PDF Full Text of this paper here.